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SCANNING ELECTRON MICROSCOPY IN MATERIALS SCIENCE

  • Days

    From 12 December 2017 To 15 December 2017

  • Address

    CNR IMM Bologna, Via Gobetti 101, 40129 - Bologna, Italy

  • SOLDOUT

    Brochure :

events content
La scuola, organizzata dalla SISM e dall'Istituto CNR-IMM di Bologna, intende fornire i concetti e i principi fisici di base per l’utilizzo delle tecniche di microscopia elettronica a scansione e di microanalisi nell’ambito della scienza dei materiali. La scuola è rivolta a ricercatori, tecnici e studenti che intendano acquisire le competenze necessarie per il corretto utilizzo della microscopia elettronica a scansione (SEM), delle tecniche analitiche ad essa correlate e dei fasci ionici focalizzati (FIB) per lo studio e la caratterizzazione dei materiali. La scuola prevede sia lezioni teoriche che sessioni pratiche che prevedono di operare alle facilities strumentali di IMM Bologna che comprendono un SEM-FEG ed un SEM ambientale. E' inoltre prevista una sessione dimostrativa di utilizzo di strumentazione FIB/EBL, installata in ambiente controllato (Clean Room).
Price bundles
  1. FULL REGISTRATION Members : €300.00  Non-Members :€ 400.00

    Full registration


  2. STUDENT REGISTRATION Members : €210.00  Non-Members :€ 280.00

    Student registration


Gallery

Contatti evento:
Dr. Roberto BALBONI

CNR

IMM - Sez. Bologna

Phone : 051/6399186

balboni@bo.imm.cnr.it

2018-2019 Pier Giorgio Merli (S)TEM SCHOOL IN MATERIALS SCIENCE

  • Days

    From 19 November 2018 To 23 November 2018

    From 4 February 2019 To 8 February 2019

  • Address

    CNR - IMM Sezione di Bologna
    Area della Ricerca
    Via P. Gobetti 101, 40129 Bologna, Italy

  • SOLDOUT

    Brochure :

events content
The “Pier Giorgio Merli” Transmission Electron Microscopy School, jointly organised by SISM and CNR-IMM, has gained its 7th edition. As in previous editions, in two full weeks, following a well tested series of theoretical and practical lessons, the School will provide students and researchers with a qualified introduction to Transmission and Scanning Transmission Electron Microscopy techniques for materials science.

        The first theoretical part of the School (November 19-23, 2018) will start with a presentation of the elements of electron optics needed to introduce the TEM/STEM working principles and will continue with a comprehensive lesson on radiation damage to warn the students of the downsides and the possible artefacts of these powerful investigation techniques. Some essential aspects of the theory of the electron diffraction will then be used to describe the elastic interaction of the electron beam with the crystalline sample and the electron microscopy techniques that immediately follow: Selected Area and Convergent Beam Electron Diffraction (SAED and CBED). Examples of their application for crystallographic phases identification and strain determination will be illustrated. Basic crystallography notions will be also recalled in a specific lesson. The contrast mechanisms in TEM and STEM (diffraction, phase and mass-thickness) will be successively presented for their importance in studies of lattice defects, nanoparticles and nanotubes in solids and devices. In recent year, TEM/STEM imaging techniques have attained atomic resolution for all the materials of interest in materials science. In our course, a unique theory of image formation will be used to describe both the coherent (HREM) and incoherent (HAADF-STEM) approach to these high resolution techniques. The main aspects of the inelastic interaction of the electron beam with the sample will be presented to describe the two essential analytical techniques for compositional analysis: EDS and EELS. Finally, electron holography and interferometric methods will be introduced to show either the possibility to record the phase of the electron wave and to determine electric potential variations inside the samples or as alternative techniques in phase analysis and strain determination.

        In the second week (February 4-8, 2019), what learnt during the first half of the school will be put into practice. Students, under teacher’s supervision, will be allowed to directly operate on the 200 kV Schottky FEG TEM-STEM (FEI Tecnai F20 ST) installed at the CNR-IMM Institute. During this week, students will be also trained to the use of some of the available simulation and data processing software essential for TEM/STEM work. Selected presentations of new products by representatives of TEM/STEM manufacturers, sample preparation instruments and accessories for electron microscopy are also planned.

        At the end of the School a certificate of attendance will be given to all the participants and upon request a certificate of the acquired skills, that may be also used for obtaining academic credits, may be issued after passing a written examination.

As participation to the School is open to people from all countries the official language is English.

Important notice: participants may choose to attend either the whole course or the theoretical part only (it is not possible to register for the practical course only). As to the practical course, to guarantee enough operating time to all the students, the maximum number of participants is limited to 10. The School will take place only if a minimum number of 6 registrations to both the theoretical and practical courses will be reached.
Price bundles
  1. THEORETICAL AND PRACTICAL Members : €1360.00  Non-Members :€ 1700.00

    Full course


  2. THEORETICAL AND PRACTICAL - STUDENT Members : €952.00  Non-Members :€ 1190.00

    Full course at reduced price for students


  3. THEORETICAL PART Members : €560.00  Non-Members :€ 700.00

    Theoretical course only


  4. THEORETICAL PART - STUDENTS Members : €392.00  Non-Members :€ 490.00

    Theoretical course only at reduced price for students



Contatti evento:
Dr. Andrea PARISINI

CNR-IMM

Sezione di Bologna

Phone : 051-6399149

parisini@bo.imm.cnr.it

SEM School In Materials Science

  • Days

    From 9 April 2019 To 12 April 2019

  • Address

    CNR IOM Area Science Park Trieste, Italy

  • SOLDOUT

    Brochure :

events content
The school will take place at the Istituto Officina dei Materiali (IOM), located in the AREA Science Park, Basovizza - Trieste, in Italy. The school will be open to a maximum of 24 participants. A minimum number of 10 attendees is required to activate the courses. Registration to the school is obtained by signing up before March 15th. Students and young researchers with a temporary position can claim an additional 30% discount on the fees (VAT excluded). For any payment an invoice will be issued. Please note that, for employees of Italian public institutions, the fee is exempt from VAT (Article 10 of DPR 633/72).
Price bundles
  1. REGULAR Members : €300.00  Non-Members :€ 400.00

    Standard registration


  2. STUDENT Members : €210.00  Non-Members :€ 280.00

    Student and temporay staff registration


Gallery

Contatti evento:
Dr. Regina Ciancio

IOM-CNR TASC

Phone : 0403756467

ciancio@iom.cnr.it

Aldo Armigliato SEM School in Materials Science

  • Days

    From 9 November 2020 To 13 November 2020

  • Address

    CNR - Institute for Microelectronics and Microsystems
    Bologna Research Area
    via P. Gobetti 101
    40129 Bologna
    Italy

  • SOLDOUT

    Brochure :

events content
La scuola, organizzata dalla SISM e dagli Istituti IMM-Bologna e IOM-Trieste del CNR, intende fornire i concetti e i principi fisici di base per l’utilizzo delle tecniche di microscopia elettronica a scansione e di microanalisi nell’ambito della scienza dei materiali.
È rivolta a ricercatori, tecnici e studenti che intendano acquisire le competenze necessarie per il corretto utilizzo della microscopia elettronica a scansione (SEM), delle tecniche analitiche ad essa correlate e dei fasci ionici focalizzati (FIB) per lo studio e la caratterizzazione dei materiali.
La scuola prevede sia lezioni teoriche che sessioni pratiche.
A causa delle restrioni imposte dalla epidemia COVID, la scuola avrà luogo solo in modalità on-line.
Verranno organizzate sessioni in modalità remota per tutti i partecipanti sia per la parte teorica che per la parte pratica.
Price bundles
  1. CORSO COMPLETO (sold out) Members : €300.00  Non-Members :€ 400.00

    Corso completo (teoria e pratica)


  2. CORSO COMPLETO STUDENTI(sold out) Members : €210.00  Non-Members :€ 280.00

    Corso completo per studenti, PhD, pers. non strutturato


  3. CORSO TEORICO(sold out) Members : €150.00  Non-Members :€ 200.00

    Solo parte teorica


  4. CORSO TEORICO STUDENTI(sold out) Members : €105.00  Non-Members :€ 140.00

    Solo parte teorica per studenti, PhD, pers. non strutturato


  5. CORSO COMPLETO ON-LINE Members : €100.00  Non-Members :€ 100.00

    Corso completo on-line COVID



Contatti evento:
Dr. Roberto BALBONI

CNR

IMM - Sez. Bologna

Phone : 051/6399186

balboni@bo.imm.cnr.it

Pier Giorgio Merli (S)TEM SCHOOL IN MATERIALS SCIENCE - 8th Edition

  • Days

    From 3 October 2022 To 7 October 2022

    From 10 October 2022 To 14 October 2022

  • Address

    CNR - IMM Sezione di Bologna
    Area della Ricerca
    Via P. Gobetti 101, 40129 Bologna, Italy

  • SubScribe

    Brochure :

Subscriptions close on 30 Sep 2022
events content
The 8th edition of the Pier Giorgio Merli (Scanning) Transmission Electron Microscopy School, jointly organized by SISM and CNR-IMM, is finally scheduled to be held in early autumn 2022 as an in-person event. In two full weeks, the School will provide students and researchers engaged in the materials science field (physics, chemistry, engineering) with a qualified introduction to Transmission and Scanning Transmission Electron Microscopy techniques.

In the first week (October 3-7, 2022) the theoretical background of the main (S)TEM techniques and their simulation algorithms will be detailed. The basis of analytical techniques like EDS and EELS will be also introduced.

In the second week of the School (October 10-14, 2022), the knowledge acquired during the first part will be put into practice. Students, under teacher’s supervision, will operate on the 200 kV (S)TEM installed at the CNR-IMM Institute. Examples of plan-view and cross-sectional TEM samples as well as FIB TEM lamellas preparations will be illustrated.

For the School's fees and for a more complete description of the School’s subjects, please download the brochure and refer to the School’s web site:


The official language is English.

Important notice: applications to the school may be submitted by filling the registration form directly on this website. Applicants may choose to attend either the whole course or the theoretical part only. Please note that it is not possible to register for the practical course only. It will be also possible to attend the theoretical part as a virtual event. As to the practical course, to guarantee enough operating time to all the students, the maximum number of participants is limited to 10. After application acceptance, the School registration has to be completed on this same SISM web site. The School will take place only if a minimum number of 6 registrations to both the theoretical and practical courses will be reached.


SCHOOL REGISTRATIONS ARE OPEN, PLACES ARE AVAILABLE FOR BOTH FULL COURSE (THEORETICAL + PRACTICAL PARTS) AND THEORETICAL PART (IN-PERSON OR VIRTUAL).

Price bundles
  1. FULL COURSE THEORETICAL AND PRACTICAL SESSIONS Members : €1450.00  Non-Members :€ 1500.00

    Researcher


  2. FULL COURSE THEORETICAL AND PRACTICAL SESSIONS Members : €950.00  Non-Members :€ 1000.00

    Young scientist


  3. THEORETICAL SESSION (IN PRESENCE) Members : €600.00  Non-Members :€ 650.00

    Researcher


  4. THEORETICAL SESSION (IN PRESENCE) Members : €400.00  Non-Members :€ 450.00

    Young scientist


  5. THEORETICAL SESSION (VIRTUAL) Members : €400.00  Non-Members :€ 450.00

    Researcher/Young scientist



Contatti evento:
Dr. Andrea PARISINI

CNR-IMM

Sezione di Bologna

Phone : 051-6399149

parisini@bo.imm.cnr.it