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The “Pier Giorgio Merli” Transmission Electron Microscopy School, jointly organised by SISM and CNR-IMM, has gained its 7th edition. As in previous editions, in two full weeks, following a well tested series of theoretical and practical lessons, the School will provide students and researchers with a qualified introduction to Transmission and Scanning Transmission Electron Microscopy techniques for materials science.

        The first theoretical part of the School (November 19-23, 2018) will start with a presentation of the elements of electron optics needed to introduce the TEM/STEM working principles and will continue with a comprehensive lesson on radiation damage to warn the students of the downsides and the possible artefacts of these powerful investigation techniques. Some essential aspects of the theory of the electron diffraction will then be used to describe the elastic interaction of the electron beam with the crystalline sample and the electron microscopy techniques that immediately follow: Selected Area and Convergent Beam Electron Diffraction (SAED and CBED). Examples of their application for crystallographic phases identification and strain determination will be illustrated. Basic crystallography notions will be also recalled in a specific lesson. The contrast mechanisms in TEM and STEM (diffraction, phase and mass-thickness) will be successively presented for their importance in studies of lattice defects, nanoparticles and nanotubes in solids and devices. In recent year, TEM/STEM imaging techniques have attained atomic resolution for all the materials of interest in materials science. In our course, a unique theory of image formation will be used to describe both the coherent (HREM) and incoherent (HAADF-STEM) approach to these high resolution techniques. The main aspects of the inelastic interaction of the electron beam with the sample will be presented to describe the two essential analytical techniques for compositional analysis: EDS and EELS. Finally, electron holography and interferometric methods will be introduced to show either the possibility to record the phase of the electron wave and to determine electric potential variations inside the samples or as alternative techniques in phase analysis and strain determination.

        In the second week (February 4-8, 2019), what learnt during the first half of the school will be put into practice. Students, under teacher’s supervision, will be allowed to directly operate on the 200 kV Schottky FEG TEM-STEM (FEI Tecnai F20 ST) installed at the CNR-IMM Institute. During this week, students will be also trained to the use of some of the available simulation and data processing software essential for TEM/STEM work. Selected presentations of new products by representatives of TEM/STEM manufacturers, sample preparation instruments and accessories for electron microscopy are also planned.

        At the end of the School a certificate of attendance will be given to all the participants and upon request a certificate of the acquired skills, that may be also used for obtaining academic credits, may be issued after passing a written examination.

As participation to the School is open to people from all countries the official language is English.

Important notice: participants may choose to attend either the whole course or the theoretical part only (it is not possible to register for the practical course only). As to the practical course, to guarantee enough operating time to all the students, the maximum number of participants is limited to 10. The School will take place only if a minimum number of 6 registrations to both the theoretical and practical courses will be reached.

UPDATE: Available places for the full course taking place from 3 to 7 October 2022 (theoretical part) and from 10 to 14 October 2022 (practical part) are sold out.

Owing to ongoing participation requests we decided to keep open the full course registrations proposing a second practical course in March 2023. Thus, from now on full course registrations will refer to the same theroretical part from 3 to 7 October 2022 (in presence) and a new practical part in March 2023 (exact date to be defined).

The 8th edition of the Pier Giorgio Merli (Scanning) Transmission Electron Microscopy School, jointly organized by SISM and CNR-IMM, is finally scheduled to be held in early autumn 2022 as an in-person event. In two full weeks, the School will provide students and researchers engaged in the materials science field (physics, chemistry, engineering) with a qualified introduction to Transmission and Scanning Transmission Electron Microscopy techniques.

In the first week (October 3-7, 2022) the theoretical background of the main (S)TEM techniques and their simulation algorithms will be detailed. The basis of analytical techniques like EDS and EELS will be also introduced.

In the second week of the School (October 10-14, 2022), the knowledge acquired during the first part will be put into practice. Students, under teacher’s supervision, will operate on the 200 kV (S)TEM installed at the CNR-IMM Institute. Examples of plan-view and cross-sectional TEM samples as well as FIB TEM lamellas preparations will be illustrated.

temschool.bo.imm.cnr.it

The official language is English.

Important notice: applications to the school may be submitted by filling the registration form directly on this website. Applicants may choose to attend either the whole course or the theoretical part only. Please note that it is not possible to register for the practical course only. It will be also possible to attend the theoretical part as a virtual event. As to the practical course, to guarantee enough operating time to all the students, the maximum number of participants is limited to 10. After application acceptance, the School registration has to be completed on this same SISM web site. The School will take place only if a minimum number of 6 registrations to both the theoretical and practical courses will be reached.