It is well known the existence of a world much larger than that on human scale,
populated by planets, stars, black holes, etc. and we know how to observe it:
through a telescope but, is there also an infinitely small world? Yes, it exists and
we can observe it! How? Through an electron microscope. The exhibition is
designed to give the opportunity to know the "nanoworld". The visitor feels like
a researcher who observes, between curiosity and amazement, real images of
nature and man-made technology. What we are proposing is an exhibition of
images of micro and nanometric structures obtained through a scanning
electron microscope (SEM) completed by dimensional scale and their magnifications.
The exhibited images, which also have a strong aesthetic value, are
accompanied by technical-scientific information, three-dimensional models
and interactive exhibits.

The workshop is jointly organized by STMicroelectronics and the Institute for Microelectronics and Microsystems of the Italian National Research Council (IMM-CNR). It represents a melting point between the academic and research world and the industrial development in the field of the structural characterization and the microanalysis by electron microscopy.

The scope of the event will be focused on new methods applied to semiconductor devices (silicon based, wide band gap, metallic interconnections, nanotechnology, etc) and materials science. It will highlight recent progress in instrumentation, in chemical and structural analysis, in sample preparation by mechanical thinning and by FIB, as well as in situ devices polarization dependent analyses.

The scientific program will be opened by a lectio magistralis delivered by Prof. Giulio Pozzi (Department of  Physics and Astronomy, University of Bologna and Ernst Ruska-Centre and Peter Grünberg Institute, Forschungszentrum Jülich) regarding Electron Holography: from the beginning to recent developments. The session will continue with scientific presentations given by researchers coming from STMicroelectronics, IMM-CNR, ENEA, LETI CEA, Cemes CNRS and Companies specialized in electron microscopy.

The workshop will present new insights focusing on the following topics:

TEM: Advanced Structural Characterization (STEM, nBED, Holodark, Tomography, ASTAR, …) and related  Spectroscopic Techniques  (EELS, EDS)

SEM: Advanced Characterization  (EBIC, Voltage Contrast, EDS, …)

Novel specimen preparation techniques by FIB

Materials: SiC, Phase Change  Materials, Metal Alloys, nanowire, ...

Latest company products: Helium Ion Microscope, New generation of (S)TEM and FIB, Highly controlled mechanical specimen preparation,..

Diaspro Lab - https://www.iit.it/index.php/people/alberto-diaspro -  offers a great Nanoscale School at the Venetian  Institute of of Sciences (IVSLA), Letters and Arts.

The objective of this School is to advance the field of nanoscale optical microscopy operating at the scale of nanometres to tens of nanometres, through the exchange of information, ideas, and innovative techniques. The understanding of methods and techniques has the great potential of allowing, in the near future, for the design and performance of new exciting experiments in Biophysics, Optics and Photonics. Shots of current technologies by companies leaders in the field.

An amazing blend of top level lecturers ready for lessons, seminars and student interactions in the amazing scenario offered by Venice in June.

Bando  IOM AR 004/2018 TS

Selezione per titoli e colloquio per il conferimento di 1 Assegno di Ricerca POST DOTTORALE

Attività: “Caratterizzazione avanzata mediante microscopia elettronica di materiali nanostrutturati ed eterostrutture basate su sistemi a forte correlazione elettronica”
L’attività rientra nell’ambito dello sviluppo di infrastrutture di ricerca innovative aperte all’utenza internazionale con finanziamento sia nazionale (Progetto Strategico di interesse nazionale italiano NFFA-Trieste Demonstrator) che comunitario (Progetto RIA Horizon2020 NFFA-Europe).

a)    diploma di laurea  e titolo di dottore di ricerca (di durata minima triennale) in Fisica o materie affini;
b)    comprovata esperienza (dichiarata con le modalità di cui all’art. 4) nel campo della microscopia elettronica in trasmissione e caratterizzazione delle proprietà chimico-fisiche di materiali, nonché buona conoscenza delle tematiche di ricerca tipiche della scienza dei materiali generalmente affrontate con la microscopia elettronica e della complementarietà di quest'ultima con altre tecniche sperimentali;
c)    Conoscenza della lingua inglese;
d)    Conoscenza di base della lingua italiana (per i candidati stranieri)

Struttura destinataria : Sede di Trieste
Sede (provincia) : TS
Durata: 12 mesi

Scadenza presentazione domande: 20 luglio 2018

The 7th International Workshop on Focused Electron Beam-Induced Processing (FEBIP), will be held in Modena (Italy) from 10 to 13 of July 2018.

It follows the editions of 2006 in Delft (NL), 2008 in Thun (CH), 2010 in Albany (US), 2012 in Saragoza (ES), 2014 in Frankfurt (DE) and 2016 in Vienna (AT).

The workshop is organized by the Nanoscience Institute of National Research Council (CNR), Modena S3.