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Corso Base integrato di microscopia confocale e microscopia elettronica SEM/S(T)EM

  • Days

    30 November -0001

  • Address

    Universitá degli Studi di Modena e Reggio Emilia, Modena

  • Brochure :

events content
Il Dipartimento di Scienze della Vita ed il Centro Interdipartimentale Grandi Strumenti (C.I.G.S.) dell’Università degli Studi di Modena e Reggio Emilia, in collaborazione con la Società Italiana di Immunobiologia Comparata e dello Sviluppo (SIICS) e la Società Italiana di Scienze Microscopiche (SISM), organizzano il “13° Corso di Microscopia Confocale: Basi Teoriche e Pratiche” ed il “7°Corso di Microscopia Elettronica SEM e S(T)EM: Basi Teoriche e Pratiche”. Il primo corso è indirizzato a tutti coloro che sono interessati ad acquisire gli elementi di base necessari per utilizzare la microscopia confocale in ambito biologico mentre il secondo è dedicato all'utilizzo della microscopia elettronica a scansione (anche in modalità S(T)EM con detector per elettroni trasmessi) soprattutto in ambito biomedico. Entrambi i corsi prevedono lezioni teoriche in aula e sessioni pratiche in laboratorio. Per informazioni: dott. Malagoli (davide.malagoli@unimore.it), dott.ssa Accorsi (alice.accorsi@unimore.it).
Price bundles
  1. CORSO COMPLETO Members : €200.00  Non-Members :€ 350.00

    Corso Base integrato di microscopia confocale e microscopia elettronica SEM/S(T)EM


  2. CORSO COMPLETO - QUOTA RIDOTTA Members : €150.00  Non-Members :€ 150.00

    Corso Base integrato di microscopia confocale e microscopia elettronica SEM/S(T)EM


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Contatti evento:
Dr. Massimo TONELLI

Università di Modena

CIGS

Phone : 059-2055737

massimo.tonelli@unimore.it

2018-2019 Pier Giorgio Merli (S)TEM SCHOOL IN MATERIALS SCIENCE

  • Days

    From 19 November 2018 To 23 November 2018

    From 4 February 2019 To 8 February 2019

  • Address

    CNR - IMM Sezione di Bologna
    Area della Ricerca
    Via P. Gobetti 101, 40129 Bologna, Italy

  • SubScribe

    Brochure :

events content
The “Pier Giorgio Merli” Transmission Electron Microscopy School, jointly organised by SISM and CNR-IMM, has gained its 7th edition. As in previous editions, in two full weeks, following a well tested series of theoretical and practical lessons, the School will provide students and researchers with a qualified introduction to Transmission and Scanning Transmission Electron Microscopy techniques for materials science.

        The first theoretical part of the School (November 19-23, 2018) will start with a presentation of the elements of electron optics needed to introduce the TEM/STEM working principles and will continue with a comprehensive lesson on radiation damage to warn the students of the downsides and the possible artefacts of these powerful investigation techniques. Some essential aspects of the theory of the electron diffraction will then be used to describe the elastic interaction of the electron beam with the crystalline sample and the electron microscopy techniques that immediately follow: Selected Area and Convergent Beam Electron Diffraction (SAED and CBED). Examples of their application for crystallographic phases identification and strain determination will be illustrated. Basic crystallography notions will be also recalled in a specific lesson. The contrast mechanisms in TEM and STEM (diffraction, phase and mass-thickness) will be successively presented for their importance in studies of lattice defects, nanoparticles and nanotubes in solids and devices. In recent year, TEM/STEM imaging techniques have attained atomic resolution for all the materials of interest in materials science. In our course, a unique theory of image formation will be used to describe both the coherent (HREM) and incoherent (HAADF-STEM) approach to these high resolution techniques. The main aspects of the inelastic interaction of the electron beam with the sample will be presented to describe the two essential analytical techniques for compositional analysis: EDS and EELS. Finally, electron holography and interferometric methods will be introduced to show either the possibility to record the phase of the electron wave and to determine electric potential variations inside the samples or as alternative techniques in phase analysis and strain determination.

        In the second week (February 4-8, 2019), what learnt during the first half of the school will be put into practice. Students, under teacher’s supervision, will be allowed to directly operate on the 200 kV Schottky FEG TEM-STEM (FEI Tecnai F20 ST) installed at the CNR-IMM Institute. During this week, students will be also trained to the use of some of the available simulation and data processing software essential for TEM/STEM work. Selected presentations of new products by representatives of TEM/STEM manufacturers, sample preparation instruments and accessories for electron microscopy are also planned.

        At the end of the School a certificate of attendance will be given to all the participants and upon request a certificate of the acquired skills, that may be also used for obtaining academic credits, may be issued after passing a written examination.

As participation to the School is open to people from all countries the official language is English.

Important notice: participants may choose to attend either the whole course or the theoretical part only (it is not possible to register for the practical course only). As to the practical course, to guarantee enough operating time to all the students, the maximum number of participants is limited to 10. The School will take place only if a minimum number of 6 registrations to both the theoretical and practical courses will be reached.
Price bundles
  1. THEORETICAL AND PRACTICAL Members : €1360.00  Non-Members :€ 1700.00

    Full course


  2. THEORETICAL AND PRACTICAL - STUDENT Members : €952.00  Non-Members :€ 1190.00

    Full course at reduced price for students


  3. THEORETICAL PART Members : €560.00  Non-Members :€ 700.00

    Theoretical course only


  4. THEORETICAL PART - STUDENTS Members : €392.00  Non-Members :€ 490.00

    Theoretical course only at reduced price for students



Contatti evento:
Dr. Andrea PARISINI

CNR-IMM

Sezione di Bologna

Phone : 051-6399149

parisini@bo.imm.cnr.it