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 Cos'è la SISM
 Sede Legale
 La rivista Microscopie
 Area Soci
 Eventi SISM
 Altri eventi
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Altri eventi

LAMBS, MicroScoBio, Genoa - 31 gennaio 2006 - 3 febbraio 2006

7D EXPLORATION OF THE LIVING WORLD Key scientists in the fi eld will give talks on hot subjects in 3d confocal microscopy including multiphoton imaging, `f` techniques, biomedical applications. Training will be on confocal and multiphoton spectral microscopes, ultrafast laser Ti:sapphire laser sources and image deconvolution workstations. 4D (xy- z-t), FRET, FRAP, FLIM and SHG experiments will be performed. students are encouraged to bring their own samples since cell culture, chemical, cell biology facility will be available.

Focus on Microscopy 2006
Perth, Western Australia - Sunday April 9th - Wednesday April 12th, 2006


EMAS 2006 - 7th Regional Workshop - Karlsruhe, Germany
Karlsruhe, Germany - 13 - 16 May 2006

The EMAS Regional Workshop is a biennial event designed to provide postgraduate students, and researchers and technicians in materials science and engineering with basic knowledge of the capabilities and limitations of electron probe X-ray microanalysis (EPMA). The workshop is arranged as a low-cost meetings with lectures on practical and theoretical aspects of EPMA given by internationally recognised experts. The format and content of the of the meetings are tailored to the needs of the practical microanalyst routinely dealing with problems of specimen preparation, instrumental procedures, data collection and quantification, as well as the needs of researchers keen to obtain a deeper understanding of the physics underlying X-ray production, measurement and analysis. The core topics of 7th EMAS Regional Workshop are: Electron beam - specimen interactions Basic Monte Carlo simulation X-ray spectroscopy Sample preparation Analytical electron microscopy Quantitative electron probe microanlysis Light element and thin film analysis Tel: 0049-7247-951255; Fax: 0049-7247-951591

Email: christine.walther@cec.eu.int


CORSO ASSING di Microscopia Elettronica
Pratica di Mare (RM) 5-7 giugno 2006

Corso Teorico/Pratico di Microscopia Elettronica in Failure Analysis su materiali metallici

Email: e.garofalo@assing.it

Giornate di studio sulla caratterizzazione microstrutturale dei materiali per l`ingegneria
Dipartimento di ingegneria dei Materiali e Tecnologie Industriali - Università Degli studi di Trento - 13-16 giugno 2006

VII Scuola P. Giordano Orsini

The 4th Principles of Fluorescence Techniques course
Genova, Italy, June 19-22 2006

This course will build upon the previous successful sessions. It is directed towards students using fluorescence techniques in the course of their studies, and scientists working in private companies or academic institutions using fluorescence techniques to conduct their research. The topics covered will include: Basic Definitions and Principles of Fluorescence Fluorescence Polarization Time-Resolved Fluorescence Instrumentation Data Manipulation and Analysis Confocal Fluorescence Microscopy

Email: coordinator@fluorescence-foundation.org


The Second Super STEM summer school
Liverpool, 23-25 June 2006

With the growing success of aberration corrected electron microscopes, and implementation of correctors in commercial instruments, there is an increasing need for an advanced school to educate graduate students and researchers wanting a deeper understanding of the optics and capabilities of these instruments. The SuperSTEM Summer School aims to cover the background, operation and application of aberration corrected electron microscopes.


Delft Workshop on electron beam induced deposition
Delft, 26th and 27th of June, 2006

We are proud to announce that we, the Charged Particle Optics Group from the Delft University of Technology, are organizing the first Delft Workshop on Electron Beam Induced Deposition. Electron beam induced deposition (EBID) has been studied for many years, starting already in the early 1960’s. It is a versatile technique which allows the direct three-dimensional fabrication of structures with sizes ranging from micrometers to nanometers. A great advantage of the technique is that it is resist-less and fabrication and inspection of structures can both be done in situ. A number of developments have increased interest in EBID in recent years. Initially ion beam induced deposition (IBID) was often used as a mask repair technique for optical lithography. However, because the unavoidable implantation of Ga atoms with IBID was unacceptable for 157 nm lithography, EBID became a good candidate as a future mask repair technique. Apart from this, with the demonstration that EBID allows the fabrication of sub-5 nanometer structures, the door has been opened to new applications in a truly single-digit nanometer regime with few other techniques to compete. And last but not least, the rise of scanning electron microscopes having gas injection systems or environmental chambers has made EBID available to many users. Promising as the possibilities may sound, real breakthroughs have been obstructed by the fact that the process is very complex. There has been, for instance, little progress in controlling the composition of the deposits fully, or in modelling the entire process quantitatively. Major reasons for that may be that there is little interaction between electron microscopists doing EBID and experts in other fields critical in solving the mentioned issues, and there is no identifiable EBID research community. In organizing this workshop, we hope to bring together people from different fields important for the understanding of the EBID process, viz. scientists working on EBID and scientists working on surface chemistry, interaction between electrons and matter, interaction between electrons and precursor molecules, etc. It is our intent to identify the key issues and find new roads to bring the understanding of the process to a level that is sufficient to use EBID as a viable nanofabrication tool.

Email: ebidworkshop@mailhost2.tn.tudelft.nl


“Festival of Microscopy” in the UK – 23rd - 30th June 2006
Regno Unito, 23-30 Giugno 2006

23rd-25th June 2006 - SuperSTEM Summer School, CLRC Daresbury Laboratory, UK http://www.superstem.dl.ac.uk/ 26th June 2006 - ESEM VII, 7th Annual European ESEM User club meeting, Novotel ExCel, London, UK http://www.rms.org.uk/event_esem.shtml *** EMS sponsored event *** 27th - 29th June 2006 - MICROSCIENCE 2006, ExCel Centre, London, UK http://www.microscience2006.org.uk Note: MICROSCIENCE 2006 includes UK SPM 2006 30th June 2006 - In Situ Electron Microscopy and Analysis, Institute of Physics, London, Portland Place. http://conferences.iop.org/ISEM/

Microscopy & Microanalysis 2006
July 30-August 3, 2006 - Festival Hall at Navy Pier - Chicago, Illinois - USA


Single Particle Cryo-EM School in Brazil
Brazil, 24 August–5 September 2006

The Second Brazil School for Single Particle Cryo Electron Microscopy - 2006 will be an intensive 12 days hands-on course for learning the processing of single-particle cryo EM data from A to Z. The attendees can be those who are entirely new to the approach, or those for who the technique is of growing importance and who wish to acquire an in-depth understanding of the technique. The course covers all issues from data collection, through to the interpretation of the cryo-EM maps and the fitting of known X-ray structures.


Herceg Novi, Serbia and Montenegro - September 4-8, 2006

Eighth Annual Conference of the Yugoslav Materials Research Society

Email: yumrs@itn.sanu.ac.yu


The 16th International Microscopy Congress
September 3 - 8, 2006, Sapporo, JAPAN

Microscopy for the 21th Century

Email: info@imc16.jp


48th Symposium of the Society for Histochemistry
Palazzo dei Congressi - Stresa - Lake Maggiore (Italy) 7-10 September, 2006

A platform for talents


International Meeting on Movement as Prevention and Health
September 24-28, 2006

ISAC Satellite Workshop on Flow and image Cytometry in Free Radical Analysis


Workshop "L`ultramicrotomia per la Scienza e l`Ingegneria dei Materiali"
Trento, 26-27 Settembre 2006

Trento, 26-27 Settembre 2006 L’iniziativa vuole presentare le enormi potenzialità della ultramicrotomia, alla luce anche dei suoi più recenti sviluppi, nella preparazione di campioni per microscopia elettronica in trasmissione (TEM) ma non solo! Verrà infatti mostrata ai partecipanti sia la possibilità di sezionare campioni da osservare successivamente al TEM, con spessore di qualche decina di nanometri, sia di preparare superfici con caratteristiche peculiari, interessanti per osservazioni al microscopio elettronico a scansione (SEM) e al microscopio a forza atomica (AFM).

Email: stefania.serra@leica-microsystems.com


Cadiz (Spagna) - 18-29 Settembre 2006

on nanoparticle research The First ESTEEM Workshop will be dedicated to review the basis of Transmission Electron Microscopy (imaging and spectroscopic techniques) as well as their use in nanoparticle research. In this Workshop the practical sessions will play an important role. The participants will be divided in 8 groups of 3-4 each, allowing small groups to work at the microscopes. During this TEM-UCA Workshop 19 lectures (see program) will take place during the morning sessions. The first week will be dedicated to introduce the Transmission Electron Microscope, imaging and diffraction techniques (HREM, HAADF, Electron Diffraction, etc…) as well as TEM applications on nanoparticle research. In the second week the spectroscopic techniques (EELS, EFTEM, EDS) and advanced resources (in-situ microscopy, tomography, holography etc...) will be introduced. During the afternoons, 10 practical sessions will be organised. Among these, 4 practical sessions (90 minutes per session) will involve the use of TEM instruments. During the workshop, the participants will also have the opportunity to present their own work and place open questions and problems to be solved with electron microscopy techniques to experts in the different fields. The Workshop is limited to a maximum number of 25 attendees. If you are currently working or interested in the field of nanostructured materials and their characterization by TEM, send your preregistration as soon as possible. We look forward to seeing you in Cádiz, a coast place at the southern border of Europe and the most ancient city in Occident.

Email: susana.trasobares@uca.es


5° Workshop on Energy Loss Spectrometry and Energy Filtering
Vienna, 27. - 29. September 2006

Tutorials, Lab courses and contributed papers on recent developments in EELS/EFTEM.


New Developments in High-Pressure Freezing
Dresden October 9-11, 2006



European Focused Ion Beam Users Group (EFUG )
Wuppertal Germany on the 2nd of October


2° CORSO ASSING di Microscopia Elettronica a Scansione in Failure Analysis
Pratica di Mare (Roma) - 5/7 Dicembre 2006

La ASSING S.p.A in collaborazione con l’AERONAUTICA MILITARE e con il patrocinio della Società Italiana di Scienze Microscopiche (SISM) organizza la Seconda Scuola di Microscopia Elettronica in Failure Analysis su materiali metallici. Strumenti utilizzati: FESEM ZEISS SUPRA 35 “Gemini column” equipaggiato con Microanalisi EDS INCA ENERGY della OXFORD Docenti del corso Dr. Pier Giorgio Merli CNR-IMM Sezione Bologna Dr. Marco Vittori Antisari ENEA Casaccia (Roma) Prof. Edoardo Bemporad Università Roma TRE Dr. Massimo Catalano CNR IMM Sezione Lecce Giampiero Pallocca ASSING S.p.A

Email: e.garofalo@assing.it


Master Universitario di primo livello in Microscopia Elettronica
Università di Genova - Gennaio 2007 Gennaio 2008

Il corso, di durata annuale, si svolgerà in modo modulare da gennaio 2007 a gennaio 2008. Il master si propone di sviluppare competenze professionali specialistiche che consentano ai partecipanti al corso: § di utilizzare al meglio le diverse tecniche di microscopia ottica (microscopia in luce trasmessa e in fluorescenza, microscopia confocale a scansione laser, microscopia confocale ad eccitazione multifotonica) § di gestire le metodologie e gli strumenti di acquisizione ed elaborazione di immagini biologiche di applicare le tecniche citochimiche e di imunofluorescenza, qualitative e quantitative, per lo studio in situ della biologia cellulare La domanda di ammissione al Corso da redigere secondo il Modello A (scaricabile dal sito http://www.studenti.unige.it, al link proseguire la formazione universitaria, Master universitari) deve essere fatta pervenire entro il termine perentorio del 14.12.2006


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